Description
DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8″) pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9). Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs SEMClamp™ 25mm (1″) long with 15mm (0.6″) wide clamping area. Standard pin stub 3.2mm (1/8″). Convenient holder for clamping down samples up to 7mm overall thickness can be clamped under the strips. Ideal for wires, small tubes, strips, and smaller flat samples. Overall dimensions 33 x 25 x 9mm (1.3″ x 1″ x 0.35″) Material: machined aluminum with brass screws. Screw used is M2 x 10mm, Pan, Brass and M2 x 6mm, Pan, Brass Medium PELCO SEMClamp™ 25 x 15mm, 3.2mm (1/8″) Pin
